
List Of Figures
12 System Reference, January 2001
Figure 34 Position of Analog and Digital Pad Blocks within Groups 69
Figure 35 Group reservation of the digital dominant type 512 pin SOC series tester
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Figure 36 Group reservation of the digital dominant type 1024 pin SOC series tester
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Figure 37 Group reservation of the analog dominant type 512 pin SOC series tester
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Figure 38 Group reservation of the analog dominant type 1024 pin SOC series tester
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Figure 39 Card Cage Filling Options from DUT board "view" 78
Figure 40 Fill Order of Analog Instruments within the Digital Dominant Configuration
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Figure 41 Fill Order of Analog Instruments within the Analog Dominant Configuration
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Figure 42 Position and Numbering of DPS Pogo Pad Blocks
(see also drawings D-E6980-96540-1S34D (512 pins) and
D-E6980-96550-1S34D (1024 pins)
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Figure 43 Position and Numbering of Utility Blocks
(see also drawings D-E6980-96540-1S34D (512 pins) and
D-E6980-96550-1S34D (1024 pins)
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Figure 44 Possible Positions for EEPROM on DUT Board - View from DUT Side
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Figure 45 Positi on of Wafer Probe r DUT Bo ard and Probe Ca rd above t he Test Head
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Figure 46 Schematic Drawing of Wafer Prober DUT Board Layout - View from
DUT Side
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Figure 47 Schematic Drawing of Probe Card- View from DUT Side 107
Figure 48 General Structure of a Probe Card Segment 108
Figure 49 Digital Ground and Analog Ground 126
Figure 50 Bypass Capacitors 128
Figure 51 Microstrip Line Model 129
Figure 52 Strip Line Model 130
Figure 53 Sharp Corner 131
Figure 54 Branch (Stub) 131
Figure 55 Signal Lines 132
Figure 56 Troubleshooting DUT Board Problems 133
Figure 57 GPDPS Channel Block Diagram 137
Figure 58 General Purpose Power Supply: Power Diagram 140
Figure 59 GPDPS Channel: Simplified Block Diagram 141
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