AWG G3 PAD FOR PS3 Specifikace Strana 70

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4 Test Head Filling and DUT Board Considerations Test System Configuration
70 System Reference, January 2001
Test System Configuration
There are two types of test heads for the SOC series tester.
They are the so called digital dominant type and the so
called analog dominant type. The digital dominant type
supports more digital pins the analog dominant one
supports more analog modules. The maximum number of
digital pins and analog modules in each case is shown in
Table 4 on page 70.
Table 4 Maximum of digital pins and analog modules
Within the two types, certain groups on the DUT board
will be reserved for digital boards as others will be
reserved for analog modules. Some of the groups can
either contain analog modules or digital boards. Atten-
tion: Analog Module’s specifications can only be guaran-
teed for those groups containing analog modules only.
NOTE that referring to reserved groups rather than
reserved cages describes the test head filling from a DUT
board point of view. This is explained in Digital Domi-
nant Configuration” on page 71 and in “Analog Domi-
nant Configuration” on page 74 for both the 512 pin and
the 1024 pin SOC series tester.
Digital Dominant Analog Dominant
512 pin test
head
Max. digital
pins: 512
Max. analog
modules: 8
Max. digital
pins: 256
Max. analog
modules: 16
1024 pin test
head
Max. digital
pins: 1024
Max. analog
modules: 24
Max. digital
pins: 768
Max. analog
modules: 32
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